The effect of drain bias stress on the instability of turned-OFF amorphous HfInZnO thin-film transistors under light irradiation

Dae Woong Kwon, Jang Hyun Kim, Byung Gook Park

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'The effect of drain bias stress on the instability of turned-OFF amorphous HfInZnO thin-film transistors under light irradiation'. Together they form a unique fingerprint.

Engineering

Biochemistry, Genetics and Molecular Biology