Abstract
In this letter, the advantages of an antiferroelectric (AFE) and ferroelectric (FE) bilayer stack made of HfxZr1-x O2(HZO) with different compositions were reported. Compared to the monolayer ferroelectric control sample, Mo/FE/Mo, the Mo/FE/AFE/Mo, and Mo/AFE/FE/Mo stacks exhibited a significant decrease in the coercive field (Ec). A higher dielectric constant of AFE increased the voltage distribution across the FE layer in the bilayer HZO structure, leading to a decrease in Ec. Furthermore, the capacitor with Mo/AFE/FE/Mo exhibited 28% higher polarization, Pr (2Pr = 45.9 μ C/cm2) , than the control sample, while this significant increase of Pr was not observed in the capacitor with Mo/FE/AFE/Mo. Electrical measurements of the capacitors with FE and AFE having various thicknesses showed that the dielectric constants and phase composition depend on the deposition sequence. A higher orthogonal phase ratio was achieved in the Mo/AFE/FE/Mo stack compared to the Mo/FE/AFE/Mo stack, resulting in higher polarization. Furthermore, bilayer capacitors with Mo/AFE/FE/Mo showed more robust long time reliability, such as endurance and retention.
Original language | English |
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Pages (from-to) | 1997-2000 |
Number of pages | 4 |
Journal | IEEE Electron Device Letters |
Volume | 45 |
Issue number | 10 |
DOIs | |
State | Published - 2024 |
Bibliographical note
Publisher Copyright:© 1980-2012 IEEE.
Keywords
- antiferroelectric
- coercive field
- ferroelectric
- HfZrO bilayer
- low power consumption
- polarization
- thin film growth
- voltage distribution