Tailoring of Ferroelectric Coercive Field and Polarization with Ferroelectric and Antiferroelectric HfxZr1-xO2 Bilayer Structure

Geon Park, An H. Nguyen, Manh Cuong Nguyen, Anh Duy Nguyen, Hyunsoo Kim, Jaekyeong Kim, Kyungsoo Hwang, Hoyeon Shin, Siun Song, Rino Choi

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

In this letter, the advantages of an antiferroelectric (AFE) and ferroelectric (FE) bilayer stack made of HfxZr1-x O2(HZO) with different compositions were reported. Compared to the monolayer ferroelectric control sample, Mo/FE/Mo, the Mo/FE/AFE/Mo, and Mo/AFE/FE/Mo stacks exhibited a significant decrease in the coercive field (Ec). A higher dielectric constant of AFE increased the voltage distribution across the FE layer in the bilayer HZO structure, leading to a decrease in Ec. Furthermore, the capacitor with Mo/AFE/FE/Mo exhibited 28% higher polarization, Pr (2Pr = 45.9 μ C/cm2) , than the control sample, while this significant increase of Pr was not observed in the capacitor with Mo/FE/AFE/Mo. Electrical measurements of the capacitors with FE and AFE having various thicknesses showed that the dielectric constants and phase composition depend on the deposition sequence. A higher orthogonal phase ratio was achieved in the Mo/AFE/FE/Mo stack compared to the Mo/FE/AFE/Mo stack, resulting in higher polarization. Furthermore, bilayer capacitors with Mo/AFE/FE/Mo showed more robust long time reliability, such as endurance and retention.

Original languageEnglish
Pages (from-to)1997-2000
Number of pages4
JournalIEEE Electron Device Letters
Volume45
Issue number10
DOIs
StatePublished - 2024

Bibliographical note

Publisher Copyright:
© 1980-2012 IEEE.

Keywords

  • antiferroelectric
  • coercive field
  • ferroelectric
  • HfZrO bilayer
  • low power consumption
  • polarization
  • thin film growth
  • voltage distribution

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