Structural evolution of epitaxial SrRuO3 thin films grown on SrTiO3(001)

Sang Sub Kim; Tae Soo Kang; Jung Ho Je

doi:10.1063/1.1405135

Structural evolution of epitaxial SrRuO₃ thin films grown on SrTiO₃(001)

Sang Sub Kim, Tae Soo Kang, Jung Ho Je

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

Microstructural changes in epitaxial SrRuO₃ thin films grown on SrTiO₃(001) during the early stages of growth by pulsed laser deposition were studied using synchrotron x ray scattering. We find that at a very early stage of growth (≤ 110 Å), the film is composed of a single (110) domain only, in sharp contrast to double (110) domains reported previously for thick (≥ 1000 Å) films. As the film grows further (>110 Å), another, 90° rotated, (110) domain starts to form, coexisting with the original (110) domain. This domain evolution is attributed to strain relaxation, eventually resulting in significant atomic ordering in the in-plane direction.

Original language	English
Pages (from-to)	4407-4410
Number of pages	4
Journal	Journal of Applied Physics
Volume	90
Issue number	9
DOIs	https://doi.org/10.1063/1.1405135
State	Published - 1 Nov 2001
Externally published	Yes

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title = "Structural evolution of epitaxial SrRuO3 thin films grown on SrTiO3(001)",

abstract = "Microstructural changes in epitaxial SrRuO3 thin films grown on SrTiO3(001) during the early stages of growth by pulsed laser deposition were studied using synchrotron x ray scattering. We find that at a very early stage of growth (≤ 110 {\AA}), the film is composed of a single (110) domain only, in sharp contrast to double (110) domains reported previously for thick (≥ 1000 {\AA}) films. As the film grows further (>110 {\AA}), another, 90° rotated, (110) domain starts to form, coexisting with the original (110) domain. This domain evolution is attributed to strain relaxation, eventually resulting in significant atomic ordering in the in-plane direction.",

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AU - Kim, Sang Sub

AU - Kang, Tae Soo

AU - Je, Jung Ho

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N2 - Microstructural changes in epitaxial SrRuO3 thin films grown on SrTiO3(001) during the early stages of growth by pulsed laser deposition were studied using synchrotron x ray scattering. We find that at a very early stage of growth (≤ 110 Å), the film is composed of a single (110) domain only, in sharp contrast to double (110) domains reported previously for thick (≥ 1000 Å) films. As the film grows further (>110 Å), another, 90° rotated, (110) domain starts to form, coexisting with the original (110) domain. This domain evolution is attributed to strain relaxation, eventually resulting in significant atomic ordering in the in-plane direction.

AB - Microstructural changes in epitaxial SrRuO3 thin films grown on SrTiO3(001) during the early stages of growth by pulsed laser deposition were studied using synchrotron x ray scattering. We find that at a very early stage of growth (≤ 110 Å), the film is composed of a single (110) domain only, in sharp contrast to double (110) domains reported previously for thick (≥ 1000 Å) films. As the film grows further (>110 Å), another, 90° rotated, (110) domain starts to form, coexisting with the original (110) domain. This domain evolution is attributed to strain relaxation, eventually resulting in significant atomic ordering in the in-plane direction.

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Structural evolution of epitaxial SrRuO₃ thin films grown on SrTiO₃(001)

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