Simulation of the effects of AlGaN electron-blocking layers on the characteristics of InGaN blue light-emitting diodes

Han Youl Ryu, Sang Ho Lee

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

The internal quantum efficiency (IQE) and the forward voltage characteristics of GaN/InGaN-based blue light-emitting diodes (LEDs) are investigated based on numerical simulations. Specifically, we study the effects of structural parameters near the AlGaN electron-blocking layer (EBL), such as the Al composition of the EBL, the thickness of the GaN last barrier (LB) layer, and the doping concentration at the p-type-doped layers. When the hole concentration is sufficiently high, LEDs without the AlGaN EBL are found to show the best performances in IQE and forward voltage, implying that AlGaN-EBL-free structures can be advantageous for achieving high-efficiency LED characteristics. We also find and discuss the facts that the high hole concentration at the p-layers and the thin LB layer thickness are advantageous for high IQE and low forward voltage characteristics under the condition that the Mg diffusion into the active layers is not significant.

Original languageEnglish
Pages (from-to)1395-1399
Number of pages5
JournalJournal of the Korean Physical Society
Volume61
Issue number9
DOIs
StatePublished - Nov 2012

Bibliographical note

Funding Information:
This work was supported by the MKE (The Ministry of Knowledge Economy), Korea, under the ITRC (Information Technology Research Center) support program supervised by the NIPA (National IT Industry Promotion Agency) (NIPA-2012-H0301-12-1010), and by the IT R&D program of MKE/KEIT [KI10039216].

Keywords

  • Efficiency
  • Electron-blocking layer
  • GaN
  • Light-emitting diode

Fingerprint

Dive into the research topics of 'Simulation of the effects of AlGaN electron-blocking layers on the characteristics of InGaN blue light-emitting diodes'. Together they form a unique fingerprint.

Cite this