Robust cutting-edge detection based on intensity concentration

Wei Li, Cheng Bin Jin, Mingjie Ma, Jong Hee Kim, Hakil Kim, Xuenan Cui

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper proposes three robust detection algorithms for locating the cutting line in an image captured by a panel-cutting system. All of the proposed methods contain two stages: Edge detection and line fitting. In this paper, edge detection can search interest gradients depending on the intensity concentration. Meanwhile, the proposed line-fitting algorithm is able to precisely fit a line by minimizing the summation of L1 distance from each detected edge point to the fitted line. As the result, all of the proposed methods achieve accuracy of more than 85%. Going one step further, full-scale edge detection (FSED) obtains the best performance at 99.05%, which is evaluated by using a variety of real-world images.

Original languageEnglish
Title of host publication2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509027439
DOIs
StatePublished - 3 Jan 2017
Event2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016 - Seoul, Korea, Republic of
Duration: 26 Oct 201628 Oct 2016

Publication series

Name2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016

Conference

Conference2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016
Country/TerritoryKorea, Republic of
CitySeoul
Period26/10/1628/10/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

Keywords

  • Cutting line
  • Edge detection
  • Intensity concentration
  • Line fitting

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