Abstract
We report the preparation of arsenic doped p -type ZnO films using a Zn3 As2 ZnO target by pulsed laser deposition. Zn3 As2 was used as a p -type dopant source material for arsenic doping in ZnO. The existence of As in the As-doped ZnO films was confirmed by the x-ray photoelectron spectroscopy study. The p -type behavior of the As-doped ZnO films was determined by the Hall and photoluminescence measurements. Room temperature Hall measurements revealed that the As-doped ZnO films exhibited p -type conductivity after being annealed at 200 °C in N2 ambient for 2 min with the hole concentrations varied between 2.48× 1017 and 1.18× 1018 cm-3. The resistivity and carrier mobility of the As-doped p -type ZnO films were in the range of 2.2-6.7 cm and 0.83-11.4 cm2 V s, respectively. The low temperature photoluminescence measurements confirmed the peak associated with the neutral-acceptor bound exciton (A0 X) emission in the As-doped p -type ZnO films.
Original language | English |
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Article number | 062101 |
Pages (from-to) | 1-3 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 86 |
Issue number | 6 |
DOIs | |
State | Published - 7 Feb 2005 |
Externally published | Yes |