Optical properties of high absorption films for binary masks in extreme ultraviolet lithography

Hee Young Kang, Sungjin Park, Jai Dong Lim, Pazhanisami Peranantham, Chang Kwon Hwangbo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

We studied telluride compounds and transparent conductive oxides as high absorption materials for binary masks of extreme ultraviolet lithography at 13.5-nm wavelength. Their optical and structural properties are described.

Original languageEnglish
Title of host publicationOptical Interference Coatings, OIC 2013
PublisherOptical Society of America (OSA)
ISBN (Print)9781557529701
DOIs
StatePublished - 2013
EventOptical Interference Coatings, OIC 2013 - Whistler, Canada
Duration: 16 Jun 201321 Jun 2013

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceOptical Interference Coatings, OIC 2013
Country/TerritoryCanada
CityWhistler
Period16/06/1321/06/13

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