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Measurement of optical loss variation on thickness of InGaN optical confinement layers of blue-violet-emitting laser diodes
J. K. Son, S. N. Lee, H. S. Paek, T. Sakong, H. K. Kim, Y. Park, H. Y. Ryu, O. H. Nam, J. S. Hwang, Y. H. Cho
Research output: Contribution to journal › Article › peer-review
14
Scopus
citations