Investigation of electrochemical properties of RuO2 thin films modified by e-beam irradiation

Kyung Hwa Kim, Gil Pyo Kim, In Kyu Song, Ki Ho Yang, Byung Cheol Lee, Sung Hyeon Baeck

Research output: Contribution to journalArticlepeer-review

Abstract

The influence of electron beam irradiation on the electrochemical properties of electrodeposited RuO2 thin films was investigated using a 1 MeV electron beam. Crystallinity change before and after electron beam irradiation was investigated by X-ray diffraction, and the oxidation state of ruthenium was determined by X-ray photoelectron spectroscopy. Scanning electron microscopy was utilized to examine the morphology of the films. The results show that electron beam irradiation altered the oxidation state of ruthenium and increased crystallinity. Cyclic voltammetry was employed to evaluate the electrochemical properties of the synthesized RuO2 films in terms of their application as electrodes of electrochemical capacitors. RuO2 irradiated with 40 kGy showed 2.7 times higher capacitance (520 Fg-1) than the as-electrodeposited sample (190 Fg-1).

Original languageEnglish
Pages (from-to)3086-3089
Number of pages4
JournalThin Solid Films
Volume519
Issue number10
DOIs
StatePublished - 1 Mar 2011

Bibliographical note

Funding Information:
This work was supported by a Korea Science and Engineering Foundation (KOSEF) grant funded by the Korean government ( 2010-0018632 ).

Keywords

  • Electrodeposition
  • Electron beam irradiation
  • Energy storage
  • Ruthenium oxide (RuO)

Fingerprint

Dive into the research topics of 'Investigation of electrochemical properties of RuO2 thin films modified by e-beam irradiation'. Together they form a unique fingerprint.

Cite this