Abstract
A high-performance 3D RF transceiver with improved through-silicon via (TSV) geometry and matching for future 3D stacked memory has been introduced. It utilizes optimization method to achieve impedance matching and maximize signal integrity. TSV is accurately modeled using 3D EM solver tool (HFSS) with the matching network to generate S-parameter accurately. The proposed transceiver scheme is simulated in 65nm CMOS technology at 1V. The results show that the whole structure consumes 11.32mW and accomplishes data rate of 4Gb/s/pin.
Original language | English |
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Title of host publication | Proceedings - International SoC Design Conference 2017, ISOCC 2017 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 109-110 |
Number of pages | 2 |
ISBN (Electronic) | 9781538622858 |
DOIs | |
State | Published - 29 May 2018 |
Event | 14th International SoC Design Conference, ISOCC 2017 - Seoul, Korea, Republic of Duration: 5 Nov 2017 → 8 Nov 2017 |
Publication series
Name | Proceedings - International SoC Design Conference 2017, ISOCC 2017 |
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Conference
Conference | 14th International SoC Design Conference, ISOCC 2017 |
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Country/Territory | Korea, Republic of |
City | Seoul |
Period | 5/11/17 → 8/11/17 |
Bibliographical note
Publisher Copyright:© 2017 IEEE.
Keywords
- 3D ICs
- High bandwidth memory (HBM)
- Optimization
- RF Transceiver
- Through-silicon-via (TSV)