High-performance RF-interconnect for 3D stacked memory

Ahmed Alzahmi, Nahid Mirzaie, Chung Ching Lin, Insoo Kim, Gyung Su Byun

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

A high-performance 3D RF transceiver with improved through-silicon via (TSV) geometry and matching for future 3D stacked memory has been introduced. It utilizes optimization method to achieve impedance matching and maximize signal integrity. TSV is accurately modeled using 3D EM solver tool (HFSS) with the matching network to generate S-parameter accurately. The proposed transceiver scheme is simulated in 65nm CMOS technology at 1V. The results show that the whole structure consumes 11.32mW and accomplishes data rate of 4Gb/s/pin.

Original languageEnglish
Title of host publicationProceedings - International SoC Design Conference 2017, ISOCC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages109-110
Number of pages2
ISBN (Electronic)9781538622858
DOIs
StatePublished - 29 May 2018
Event14th International SoC Design Conference, ISOCC 2017 - Seoul, Korea, Republic of
Duration: 5 Nov 20178 Nov 2017

Publication series

NameProceedings - International SoC Design Conference 2017, ISOCC 2017

Conference

Conference14th International SoC Design Conference, ISOCC 2017
Country/TerritoryKorea, Republic of
CitySeoul
Period5/11/178/11/17

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

Keywords

  • 3D ICs
  • High bandwidth memory (HBM)
  • Optimization
  • RF Transceiver
  • Through-silicon-via (TSV)

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