Exposure Control Using Bayesian Optimization Based on Entropy Weighted Image Gradient

Joowan Kim, Younggun Cho, Ayoung Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

28 Scopus citations

Abstract

Under- and oversaturation can cause severe image degradation in many vision-based robotic applications. To control camera exposure in dynamic lighting conditions, we introduce a novel metric for image information measure. Measuring an image gradient is typical when evaluating its level of image detail. However, emphasizing more informative pixels substantially improves the measure within an image. By using this entropy weighted image gradient, we introduce an optimal exposure value for vision-based approaches. Using this newly invented metric, we also propose an effective exposure control scheme that covers a wide range of light conditions. When evaluating the function (e.g., image frame grab) is expensive, the next best estimation needs to be carefully considered. Through Bayesian optimization, the algorithm can estimate the optimal exposure value with minimal cost. We validated the proposed image information measure and exposure control scheme via a series of thorough experiments using various exposure conditions.

Original languageEnglish
Title of host publication2018 IEEE International Conference on Robotics and Automation, ICRA 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages857-864
Number of pages8
ISBN (Electronic)9781538630815
DOIs
StatePublished - 10 Sep 2018
Externally publishedYes
Event2018 IEEE International Conference on Robotics and Automation, ICRA 2018 - Brisbane, Australia
Duration: 21 May 201825 May 2018

Publication series

NameProceedings - IEEE International Conference on Robotics and Automation
ISSN (Print)1050-4729

Conference

Conference2018 IEEE International Conference on Robotics and Automation, ICRA 2018
Country/TerritoryAustralia
CityBrisbane
Period21/05/1825/05/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

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