Abstract
Titanium dioxide/polyvinylidene fluoride (TiO2/PVDF) composite was prepared by electrospinning process to enhance the dielectric properties for application as a gate insulator in organic thin-film transistors (OTFTs). Scanning electron microscopy, thermogravimetric analysis, and X-ray diffraction were employed to characterize the as-prepared samples, and then their dielectric constants were investigated by impedance analysis. The impedance results show that the dielectric constant of the electrospun TiO2/PVDF nanofibers is higher than those of other samples, demonstrating that electrospun TiO2/PVDF composite can be a proper candidate for gate insulators in OTFTs.
Original language | English |
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Pages (from-to) | 1521-1525 |
Number of pages | 5 |
Journal | Fibers and Polymers |
Volume | 14 |
Issue number | 9 |
DOIs | |
State | Published - Sep 2013 |
Bibliographical note
Funding Information:This study was supported by a grant (#10041220) from the Fundamental R&D Program for Core Technology of Materials funded by the Ministry of Knowledge Economy, Republic of Korea.
Keywords
- Dielectric properties
- Electrospinning
- Polyvinylidene fluoride
- Titanium dioxide