Abstract
A light-emitting diode (LED) structure containing p-type GaN layers with two-step Mg doping profiles is proposed to achieve high-efficiency performance in InGaN-based blue LEDs without any AlGaN electron-blocking-layer structures. Photoluminescence and electroluminescence (EL) measurement results show that, as the hole concentration in the p-GaN interlayer between active region and the p-GaN layer increases, defect-related nonradiative recombination increases, while the electron current leakage decreases. Under a certain hole-concentration condition in the p-GaN interlayer, the electron leakage and active region degradation are optimized so that high EL efficiency can be achieved. The measured efficiency characteristics are analyzed and interpreted using numerical simulations.
Original language | English |
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Article number | 181115 |
Journal | Applied Physics Letters |
Volume | 102 |
Issue number | 18 |
DOIs | |
State | Published - 6 May 2013 |
Bibliographical note
Funding Information:This work was supported by National Research Foundation of Korea Grant funded by the Korean Government (2012R1A1A2039630) and by the MSIP (Ministry of Science, ICT&Future Planning), Korea, under the C-ITRC (Convergence Information Technology Research Center) support program (NIPA-2013-H0301-13-1010) supervised by the NIPA (National IT Industry Promotion Agency).