Abstract
The effective work function (EWF) extracted on terraced oxide structures by capacitance-voltage-based techniques was compared with the work function calculated from the barrier height extracted by current-voltage measurements. The results show a reasonable correlation-within ± 0.1 eV - in the EWF values for various metal gate electrodes, validating both techniques for EWF extraction.
| Original language | English |
|---|---|
| Pages (from-to) | 598-601 |
| Number of pages | 4 |
| Journal | IEEE Electron Device Letters |
| Volume | 27 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 2006 |
| Externally published | Yes |
Keywords
- Barrier height
- High-κ
- Metal gate
- Work function