Abstract
The effective work function (EWF) extracted on terraced oxide structures by capacitance-voltage-based techniques was compared with the work function calculated from the barrier height extracted by current-voltage measurements. The results show a reasonable correlation-within ± 0.1 eV - in the EWF values for various metal gate electrodes, validating both techniques for EWF extraction.
Original language | English |
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Pages (from-to) | 598-601 |
Number of pages | 4 |
Journal | IEEE Electron Device Letters |
Volume | 27 |
Issue number | 7 |
DOIs | |
State | Published - Jul 2006 |
Externally published | Yes |
Keywords
- Barrier height
- High-κ
- Metal gate
- Work function