Charge injection from gate electrode by simultaneous stress of optical and electrical biases in HfInZnO amorphous oxide thin film transistor

Dae Woong Kwon, Jang Hyun Kim, Ji Soo Chang, Sang Wan Kim, Min Chul Sun, Garam Kim, Hyun Woo Kim, Jae Chul Park, Ihun Song, Chang Jung Kim, U. In Jung, Byung Gook Park

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

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