Analysis on enhanced depth of field for integral imaging microscope

Young Tae Lim, Jae Hyeung Park, Ki Chul Kwon, Nam Kim

Research output: Contribution to journalArticlepeer-review

27 Scopus citations

Abstract

Depth of field of the integral imaging microscope is studied. In the integral imaging microscope, 3-D information is encoded as a form of elemental images Distance between intermediate plane and object point decides the number of elemental image and depth of field of integral imaging microscope. From the analysis, it is found that depth of field of the reconstructed depth plane image by computational integral imaging reconstruction is longer than depth of field of optical microscope. From analyzed relationship, experiment using integral imaging microscopy and conventional microscopy is also performed to confirm enhanced depth of field of integral imaging microscopy.

Original languageEnglish
Pages (from-to)23480-23488
Number of pages9
JournalOptics Express
Volume20
Issue number21
DOIs
StatePublished - 8 Oct 2012
Externally publishedYes

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