A Study on the Effect of Energy Storage Systems and Distributed Generators on Reliability

Beopsoo Kim, Dayoung Lee, Nikita Rusetskii, Konstantin Shusterzon, Denis Sidorov, Minseok Song, Insu Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Recently, as many researchers introduced various methods and factors for distributed renewable energy resources and energy storage systems to the grid, the need for verification on their performance and effect to the grid is emerging. So, in this paper, we predict system marginal price (SMP) by using long short-term memory (LSTM) based on empirical data published by the Korea Power Exchange and the Korea Meteorological Administration. After then, this paper suggests an optimal energy storage system (ESS) operation strategy based on the predicted data and the dynamic programming (DP) algorithm. To verify the impact of the proposed operation strategy on power grid, a grid fault is simulated through OpenDSS to consider the power system reliability. As a result, the proposed algorithm was able to interpret the effect on the system when the ESS operator shows selfish behaviors to the system.

Original languageEnglish
Title of host publicationICEMS 2021 - 2021 24th International Conference on Electrical Machines and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages802-807
Number of pages6
ISBN (Electronic)9788986510218
DOIs
StatePublished - 2021
Event24th International Conference on Electrical Machines and Systems, ICEMS 2021 - Gyeongju, Korea, Republic of
Duration: 31 Oct 20213 Nov 2021

Publication series

NameICEMS 2021 - 2021 24th International Conference on Electrical Machines and Systems

Conference

Conference24th International Conference on Electrical Machines and Systems, ICEMS 2021
Country/TerritoryKorea, Republic of
CityGyeongju
Period31/10/213/11/21

Bibliographical note

Publisher Copyright:
© 2021 KIEE & EMECS.

Keywords

  • Dynamic Programming (DP)
  • Energy Storage System (ESS)
  • Long Short-Term Memory(LSTM)
  • Reliability

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