A new definition of voltage sag duration considering the voltage tolerance curve

Dong Jun Won, Seon Ju Ahn, Il Yop Chung, Joong Moon Kim, Seung Il Moon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

16 Scopus citations

Abstract

This paper presents a new definition of voltage sag duration which takes into consideration of the voltage tolerance characteristics of individual electrical equipment. The magnitude and the duration of voltage sag are important parameters which characterize the voltage sag event. The conventional voltage sag characterizing method can overestimate the voltage sag in case of non-rectangular sag. Furthermore it does not take the voltage tolerance characteristics of each equipment into account. Therefore the proposed method in this paper utilizes the minimum voltage(V min) of voltage tolerance curve of each equipment. The voltage sag profile is approximated with the k th radical root function and the effective duration is newly defined considering the voltage tolerance characteristics. The new voltage sag duration is applied to the non-rectangular sag originated from induction motor starting and compared to the maximum time(t max) to determine whether the voltage sag event can affect the equipment or not.

Original languageEnglish
Title of host publication2003 IEEE Bologna PowerTech - Conference Proceedings
Pages456-460
Number of pages5
DOIs
StatePublished - 2003
Externally publishedYes
Event2003 IEEE Bologna PowerTech Conference - Bologna, Italy
Duration: 23 Jun 200326 Jun 2003

Publication series

Name2003 IEEE Bologna PowerTech - Conference Proceedings
Volume3

Conference

Conference2003 IEEE Bologna PowerTech Conference
Country/TerritoryItaly
CityBologna
Period23/06/0326/06/03

Keywords

  • Diagnosis
  • Event
  • Monitoring
  • Non-rectangular sag
  • PQ
  • Power quality
  • Voltage sag
  • Voltage tolerance curve

Fingerprint

Dive into the research topics of 'A new definition of voltage sag duration considering the voltage tolerance curve'. Together they form a unique fingerprint.

Cite this